蒋廷松, 刘又文. 压电螺型位错与椭圆夹杂界面导电刚性线的干涉效应[J]. 工程力学, 2009, 26(6): 238-242.
引用本文: 蒋廷松, 刘又文. 压电螺型位错与椭圆夹杂界面导电刚性线的干涉效应[J]. 工程力学, 2009, 26(6): 238-242.
JIANG Ting-song, LIU You-wen. INTERACTION BETWEEN A PIEZOELECTRIC SCREW DISLOCATION AND AN ELLIPTICAL INCLUSION WITH INTERFACIAL ELECTRICALLY CONDUCTIVE RIGID LINE[J]. Engineering Mechanics, 2009, 26(6): 238-242.
Citation: JIANG Ting-song, LIU You-wen. INTERACTION BETWEEN A PIEZOELECTRIC SCREW DISLOCATION AND AN ELLIPTICAL INCLUSION WITH INTERFACIAL ELECTRICALLY CONDUCTIVE RIGID LINE[J]. Engineering Mechanics, 2009, 26(6): 238-242.

压电螺型位错与椭圆夹杂界面导电刚性线的干涉效应

INTERACTION BETWEEN A PIEZOELECTRIC SCREW DISLOCATION AND AN ELLIPTICAL INCLUSION WITH INTERFACIAL ELECTRICALLY CONDUCTIVE RIGID LINE

  • 摘要: 研究了无限大压电基体材料中压电螺型位错与含界面导电刚性线椭圆夹杂的电弹耦合干涉问题。运用求解复杂多连通域问题的复变函数方法,获得了椭圆夹杂和基体区域复势函数以及电弹性场的精确级数形式解答。利用广义Peach-Koehler公式导出作用于压电螺型位错上的位错力公式。主要讨论了刚性线几何尺寸和椭圆曲率对位错力的影响规律。分析结果表明:界面刚性线排斥基体中的位错,对靠近椭圆夹杂界面的螺型位错的运动和平衡位置有重要的影响。当刚性线的长度达到临界值,界面刚性线的存在会改变螺型位错与压电椭圆夹杂的干涉规律。椭圆夹杂的压缩系数变大,刚性线尺寸对位错力的影响也越大。

     

    Abstract: The electroelastic interaction between a piezoelectric screw dislocation and an elliptical inclusion containing an electrically conductive interfacial rigid line is investigated. A complex variable method for multiplying connected regions is developed, in terms of which explicit series solutions for the complex potentials and electroelastic fields in the matrix and the inclusion regions are derived. The image force acting on the piezoelectric screw dislocation is then calculated by using the generalized Peach-Koehler formula. The influence of rigid line geometry and the aspect ratio of the ellipse on the image force are discussed. The results show that the impact of the interfacial rigid line on the mobility and equilibrium position of the dislocation near an elliptical inclusion is significant. When the length of the interfacial rigid line goes up to a critical value, the existence of the rigid line can change the interaction mechanism between a screw dislocation and the piezoelectric elliptic inclusion. The effect of the length of the rigid line on the image force acting on the screw dislocation will increase with the increment of the aspect ratio of the ellipse.

     

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